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High Quality Test Pattern Generation and Boolean Satisfiability formatIsbn:Hardcover - 9781441999757 Al though the principal support

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Al though the principal support for the meeting was provided by the NATO Cornrni ttee for Scientific Affairs

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High Quality Test Pattern Generation and Boolean Satisfiability formatIsbn:Hardcover - 9781441999757 Al though the principal supportThis book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). A fast and highly fault efficient SAT based ATPG framework is presented which is also able to generate high quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects. The aim of the techniques and

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